SEICA Inc. is pleased to invite you to visit Booth #2717 at SMTA International 2026, an event bringing together innovators, engineers, and researchers to advance reliability, efficiency, and sustainability in the electronics industry. The event will take place from October 27 to 29, 2026, at the Donald E. Stephens Convention Center in Rosemont, Illinois.
Visitors to Booth #2717 will have the opportunity to discover Seica’s latest test solutions, spanning Flying Probe technology for electronic boards, semiconductor applications, and EV battery testing. These include the flagship PILOT VX, the new PILOT VX ULTRA for Probe Card Test, and the PILOT BTP, a horizontal Flying Probe system engineered specifically for EV battery testing.
All three systems are part of Seica’s new OPERA Series, a new generation of test solutions designed to address the increasing complexity and evolving requirements of modern electronics manufacturing.
The PILOT VX ULTRA will be officially launched at Electronica 2026, taking place November 10–13 at Messe München, Booth A4-459.
Seica’s flagship PILOT VX combines speed, precision, and advanced testing capabilities, delivering up to 50% faster testing, 12 multifunction heads, double-sided probing, and advanced measurement capabilities.
Building on this technology and its experience in probe card testing, Seica developed the PILOT VX XL HR to meet the specific requirements of the semiconductor market, offering a comprehensive, turnkey solution for probe card testing.
The evolution continues with the PILOT VX ULTRA for Probe Card Test, designed specifically for semiconductor applications. Combining hardware and software in a single platform, it supports the entire probe card manufacturing process, from pre-assembly checks to final validation. The system tests individual MLOs and PCBs before assembly, performs in-circuit (ICT) and functional testing of assembled PCBs, and verifies every connection during final probe card testing. Dedicated test programs automatically account for resistance variations caused by differences in network lengths or MLO components. Advanced DSP-based measurements and high-speed capacitive testing ensure accurate and reliable results, even in complex probe card applications.
For EV battery testing, the PILOT BTP offers a fully automated, horizontally oriented solution designed to provide maximum flexibility. As the latest addition to Seica’s PILOT BT product line, it is particularly well suited for prototype validation, new product introduction (NPI), and testing of prismatic battery packs, as well as for low- to medium-volume production environments where adaptability is essential.
