Events Archives - Page 3 of 7 - Seica Spa - Global supplier of Automatic Test Equipment (ATE)

SEMICON West, Booth #2061 – Seica to Demo Innovative Test Solutions If you are interested in high-throughput, parallel testing, MEMS testing, product validation, high power testing or ways to automate all of these solutions, stop by for a demo. If you plan on attending the Semicon West show in San Francisco, CA this year, make

Seica is pleased to invite to the Webinar June 10 – Register Now In the world of electronic board test, for many years flying probers have been considered good enough for prototype testing only, but today some of them can achieve unprecedented high performances in terms of quality and throughput, becoming a perfect solution also for

For years the means to test flexible circuits or Flexible Hybrid Electronics (FHE) have varied. From very simple and straight forward continuity and isolation testing seen in traditional printed circuit board (PCB) substrates using grid testers to now flying probe testers offering the end-user/contract manufacturer or original equipment manufacturer (OEM) more flexibility in the production

Seica is pleased to invite you to the Webinar:  Full Probe Card Test: Overcome the limits of MLO access, March 18. We will analyze the latest technology available for fixtureless testing of even the most challenging probe cards, through high precision, low impact probing of all types of circuits on all types of materials, including MLOs. Register Now

Seica Inc., Vice President, David Sigillo, will be presenting ‘virtually’ at the Flex Conference & Expo this February exploring the test methodologies relevant to the new age of flexible circuits for 2021. This will be an “on demand” event.  You may register to attend by following the link below. https://flex.semi.org/program/fhe-systems-flexible-circuit-testing-methodologies